Image Processing And Pattern Recognition In Remote Sensing II: 8-9 November 2004, Honolulu, Hawaii, USA (Proceedings of Spie, 5657)

Full Title:	Image Processing And Pattern Recognition In Remote Sensing II: 8-9 November 2004, Honolulu, Hawaii, USA (Proceedings of Spie, 5657)
ISBN:	0819456187
ISBN13:	9780819456182
List Price:	USD $80.00
Authors:	SPIE--The International Society for Optical Engineering cooperating organizations NASA. [et al.]
Publisher:	Random Publisher
Edition:	1st
Publish Date:	2020
Binding:	Hardcover
Pages:	300 pages
Synopsis:	Lorem ipsum dolor sit amet...
Language:	English
Dimensions:	Height: 8 in, Length: 5 in, Width: 1 in
Subjects:	Random Subject

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