Defect Recognition and Image Processing in Semiconductors and Devices, Proceedings of the 5th INT Conference, 6-10 September 1993, Santander, Spain (Institute of Physics Conference Series)

Full Title: Defect Recognition and Image Processing in Semiconductors and Devices, Proceedings of the 5th INT Conference, 6-10 September 1993, Santander, Spain (Institute of Physics Conference Series)
ISBN: 0750302941
ISBN13: 9780750302944
List Price: USD $140.00
Authors: Jimenez
J.
Publisher: Random Publisher
Edition: 1st
Publish Date: 2020
Binding: Hardcover
Pages: 300 pages
Synopsis: Lorem ipsum dolor sit amet...
Language: English
Dimensions: Height: 8 in, Length: 5 in, Width: 1 in
Subjects:

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