Electron Microscopy XIV: Selected, Peer Reviewed Papers from the XIV International Conference on Electron Microscopy Em2011, June 26-30, 2011, Wisla, Poland (Solid State Phenomena)

Full Title: Electron Microscopy XIV: Selected, Peer Reviewed Papers from the XIV International Conference on Electron Microscopy Em2011, June 26-30, 2011, Wisla, Poland (Solid State Phenomena)
ISBN: 3037853816
ISBN13: 9783037853818
List Price: USD $165.00
Authors: Trans Tech Publications
Publisher: Random Publisher
Publish Date: 2020
Binding: Hardcover
Pages: 300 pages
Synopsis: Lorem ipsum dolor sit amet...
Language: English
Dimensions: Height: 8 in, Length: 5 in, Width: 1 in
Weight: 1 lb
Subjects:

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