X-ray calibration: Techniques, sources, and detectors (Proceedings of SPIE--the International Society for Optical Engineering)

Full Title: X-ray calibration: Techniques, sources, and detectors (Proceedings of SPIE--the International Society for Optical Engineering)
ISBN: 0892527242
ISBN13: 9780892527243
List Price: USD $27.99
Authors: Paul D. Rockett
Ping Lee (Eds)
et.al.
Publisher: Random Publisher
Edition: 1st
Publish Date: 2020
Binding: Hardcover
Pages: 300 pages
Dewey decimal: 000.000
Language: English
Subjects:

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