Passive and Active Measurement: 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011, Proceedings (Lecture Notes in Computer Science, 6579)

Full Title: Passive and Active Measurement: 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011, Proceedings (Lecture Notes in Computer Science, 6579)
ISBN: 3642192599
ISBN13: 9783642192593
List Price: USD $89.99
Authors: Spring
Neil
Riley
George F.

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