Metrology And Standardization For Nanotechnology

Full Title: Metrology And Standardization For Nanotechnology
ISBN: 3527800301
ISBN13: 9783527800308
Authors: Elisabeth Mansfield
Daisuke Fujita
Debra L. Kaiser
Marcel Van de Voorde

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This is an excerpt from the ISBNdb database. Need more data? Get a FREE 7 day trial and get access to the full database of over 35 million books and all API data points including title, author, publisher, publish date, binding, pages, list price, and more.