Thin Film Analysis by X-Ray Scattering

Full Title: Thin Film Analysis by X-Ray Scattering
ISBN: 3527310525
ISBN13: 9783527310524
Authors: Birkholz, Mario

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This is an excerpt from the ISBNdb database. Need more data? Get a FREE 7 day trial and get access to the full database of over 35 million books and all API data points including title, author, publisher, publish date, binding, pages, list price, and more.

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