Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

Full Title: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
ISBN: 3540284052
ISBN13: 9783540284055
List Price: USD $279.99
Authors: Kaupp, Gerd

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