Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Full Title: | Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology) |
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ISBN: | 3540284052 |
ISBN13: | 9783540284055 |
List Price: | USD $279.99 |
Authors: |
Kaupp, Gerd |
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