Random access memory -- Congresses
Referred from 30 books

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2006 IEEE International Workshop on Memory Technology, Design, and Testing

 2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan: proceedings
sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI: co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan: in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society
Publisher: Los Alamitos, Calif. : IEEE Computer Society, c2006.
ISBN: 0769525725   ISBN13: 9780769525723   DDC: 621.39732  

Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California

 edited by R. Rajsuman; sponsored by IEEE Computer Society, Technical Committee on Test Technology
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, c1993.
ISBN: 0818641517   ISBN13: 9780818641510   DDC: 621.397320287   LCC: TK7895   Edition: (microfiche)

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

 edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
ISBN: 0818674660   ISBN13: 9780818674662   LCC: TK7895  

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  1. "Random access memory" -- Topical Term, 650/a
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  2. "Congresses" -- Form, 650/v
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