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Emami, Iraj
(Iraj Emami)
Books on 'Semiconductor wafers -- Defects -- Analysis -- Congresses':
This is the alphabetically ordered list of books of this author on '
Semiconductor wafers -- Defects -- Analysis -- Congresses
' subject (click to see subject information and books of other authors).
Process and materials characterization and diagnostics in IC manufacturing
Process and materials characterization and diagnostics in IC manufacturing: 27-28 February 2003, Santa Clara, California, USA
Kenneth W. Tobin
, Jr.,
Iraj Emami
, chairs/editors; sponsored... by SPIE--the International Society for Optical Engineering
Publisher: Bellingham, Wash., USA :
SPIE
, c2003.
ISBN: 081944846X
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