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'X-ray crystallography -- Congresses' subject
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Characterization of crystal growth defects by X-ray methods
Characterization of crystal growth defects by X-ray methods:[proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]
edited by Brian K. Tanner and D. Keith Bowen
Publisher: New York, N.Y. : Plenum Press, c1980.
ISBN: 0306406284
DDC: 548.5
LCC: QD921