This paper presents a new method for preparing samples for contextual
sensitive high-resolution ion microprobe (SHRIMP) studies of polished
thin sections. It first reviews problems associated with thin
sections and sample preparation for SHRIMP analysis. It then
describes the proposed technique, which involved coring areas of
interest from one or more thin sections and casting them, along with
a polished plug containing pieces of a calibration standard, in an
epoxy mount. The method improves the efficiency of carrying out
SHRIMP analysis.
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