Critical phenomena at surfaces and interfaces

Critical phenomena at surfaces and interfaces
Critical phenomena at surfaces and interfaces: evanescent X-ray and neutron scattering
Helmut Dosch
Publisher: Berlin ; Springer-Verlag, c1992.
ISBN: 3540545344 DDC: 530 LCC: QC1 Edition: (Berlin)

Notes:

Includes bibliographical references and index.

Classification:

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Dewey Class: 530 -- Physics
LCC Number: QC1

Book Details:

Language: eng
Physical Description: x, 145 p. : ill. ; 25 cm.
Edition Info: (Berlin)

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Subjects:

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•	Critical phenomena (Physics) (72)
•	Grazing incidence (2)
•	Neutrons -- Scattering (54)
•	Surfaces (Physics) -- Optical properties (21)
•	X-rays -- Scattering (23)

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Libraries this book has an entry in:

•	Vanderbilt University (last modified on 09/01/2008)
•	Chinese University of Hong Kong (last modified on 09/24/2006)
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•	University of Edinburgh (last modified on 12/05/2005)
•	Worcester Polytechnic Institute (last modified on 04/05/2005)
•	Boston College (last modified on 04/02/2004)
•	University of Wisconsin--Madison (last modified on 02/22/2004)

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