A Signal Integrity Engineer's Companion: Real-Time Test and Measurement and Design Simulation
A Signal Integrity Engineer's Companion: Real-Time Test and Measurement and Design Simulation (Prentice Hall PTR Signal Integrity Library) Geoff Lawday, David Ireland, Greg Edlund,
Publisher: Prentice Hall PTR
ISBN: 0131860062
DDC: 621.3822
Edition: Hardcover; 2008-06-22
Summary:
A Signal Integrity Engineer’s Companion Real-Time Test and
Measurement and Design Simulation Geoff Lawday David Ireland Greg
Edlund Foreword by Chris Edwards, Editor, IET Electronics Systems and
Software magazine Prentice Hall Modern Semiconductor Design Series
Prentice Hall Signal Integrity Library Use Real-World Test and
Measurement Techniques to Systematically Eliminate Signal Integrity
Problems This is the industry’s most comprehensive, authoritative,
and practical guide to modern Signal Integrity (SI) test and
measurement for high-speed digital designs. Three of the field’s
leading experts guide you through systematically detecting,
observing, analyzing, and rectifying both modern logic signal defects
and embedded system malfunctions. The authors cover the entire life
cycle of embedded system design from specification and simulation
onward, illuminating key techniques and concepts with
easy-to-understand illustrations. Writing for all electrical
engineers, signal integrity engineers, and chip designers, the
authors show how to use real-time test and measurement to address
today’s increasingly difficult interoperability and compliance
requirements. They also present detailed, start-to-finish case
studies that walk you through commonly encountered design challenges,
including ensuring that interfaces consistently operate with positive
timing margins without incurring excessive cost; calculating total
jitter budgets; and managing complex tradeoffs in high-speed serial
interface design. Coverage includes Understanding the complex signal
integrity issues that arise in today’s high-speed designs Learning
how eye diagrams, automated compliance tests, and signal analysis
measurements can help you identify and solve SI problems Reviewing
the electrical characteristics of today’s most widely used CMOS IO
circuits Performing signal path analyses based on intuitive
Time-Domain Reflectometry (TDR) techniques Achieving more accurate
real-time signal measurements and avoiding probe problems and
artifacts Utilizing digital oscilloscopes and logic analyzers to make
accurate measurements in high-frequency environments Simulating
real-world signals that stress digital circuits and expose SI faults
Accurately measuring jitter and other RF parameters in wireless
applications About the Authors: Dr. Geoff Lawday is Tektronix
Professor in Measurement at Buckinghamshire New University, England.
He delivers courses in signal integrity engineering and high
performance bus systems at the University Tektronix laboratory, and
presents signal integrity seminars throughout Europe on behalf of
Tektronix. David Ireland, European and Asian design and manufacturing
marketing manager for Tektronix, has more than 30 years of experience
in test and measurement. He writes regularly on signal integrity for
leading technical journals. Greg Edlund, Senior Engineer, IBM Global
Engineering Solutions division, has participated in development and
testing for ten high-performance computing platforms. He authored
Timing Analysis and Simulation for Signal Integrity Engineers
(Prentice Hall).
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