ISBNdb.com Home | Categories | Subjects | Authors | Publishers | Your Account (A)
ISBN or Keywords:
Book Info
Similar Books
Best Prices
Price History
11th IEEE International On-Line Testing Symposium
11th IEEE International On-Line Testing Symposium IOLTS 2005, Saint Raphaƫl, French Riviera, France, 6-8 July 2005
[edited by C. Metra... et al.]; sponsored by IEEE Computer Society Test Technology Technical Council
Publisher: Los Alamitos, Calif. : IEEE Computer Society, c2005.
ISBN: 0769524060  

Notes:

"IEEE Computer Society order number P2406"--T.p. verso.

Includes bibliographical references and author index.

Electronic reproduction.[New York, N.Y.]: IEEE,[2005].System
requirements: Adobe Reader.Mode of access: World Wide Web.Made
available through IEEE Xplore under title: On-Line Testing Symposium,
2005, IOLTS 2005, 11th IEEE International.

Related External Links:

IUPUI
http://opac.ieeecomputersociety.org/opac?year=2005...
Available on campus and off-campus with authorized logon

Book Details:

Language: eng
Physical Description: xv, 326 p. : ill. ; 28 cm.

Similar Books:

•  ATS 2003 (sponsored by the Test Technology Technical Council of IEEE Computer Society; in cooperation with Technical Group on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC); ISBN: 0769519512; 75% match)
•  Proceedings of the Ninth Asian Test Symposium, ATS 2000 (sponsored by IEEE Computer Society Test Technology Technical Council (TTTC); co-sponsored by National Cheng-Kung University; ISBN: 0769508871; 75% match)
•  Proceedings of the Ninth Asian Test Symposium, ATS 2000 (sponsored by IEEE Computer Society Test Technology Technical Council (TTTC); co-sponsored by National Cheng-Kung University; ISBN: 076950888X; (case); 75% match)
•  ...more similar books

Subjects:

Click on a subject to see other books listed with the same subject or to drill down into components of the subject -- such as geographical locations, dates and so on.
•  Electronic circuit design -- Congresses (31)
•  Electronic circuits -- Testing -- Congresses (70)
•  Electronic systems -- Testing -- Congresses (12)
•  Fault-tolerant computing -- Congresses (161)
•  Online data processing -- Congresses (49)

Buying this book:

We query many merchants so that you can instantly compare prices and availability. You can even check historic prices and subscribe for notifications. For a manual check, clicking on a link will open a new window with a search for this book on the merchant's site of your choice.
•  Amazon.com by title or by ISBN — widest selection, reliable service, good prices
•  Abebooks.com by title or by ISBN — good source for rare and out-of-print books
•  Textbooks.com by title or by ISBN — large inventory of new & used textbooks with free shipping (on orders over $25)
•  Alibris.com by title or by ISBN — their slogan is "books you thought you'd never find"
•  eCampus.com by title or by ISBN — they specialize in textbooks, used and new
•  BN.com by title or by ISBN — Barnes & Noble has a wide selection of new and used books

Libraries this book has an entry in:

•  Indiana University (last modified on 07/08/2009)

Copyright © 2002-2009 ISBNdb.com FAQ | Privacy Policy | Contact ISBNdb.com