Summary

(Imperial College Press) A thorough description of the techniques involved in obtaining detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and other information, using X-ray scattering. Presents examples and procedures for interpreting that data.

Classification

• Dewey Decimal: 548

Book Details

• Physical Description: 6.3"x8.8"x1.0"; 1.4 lb; 287 pages
• Edition Info: Hardcover; 2001-01-15

Subjects

• Professional & Technical -- Engineering -- Electrical & Electronics -- Semiconductors
• Professional & Technical -- Engineering -- Materials Science -- Mechanical Properties of Solids
• Professional & Technical -- Engineering -- Materials Science -- General
• Professional & Technical -- Engineering -- Materials Science -- General AAS
• Science -- Chemistry -- Crystallography
• Science -- Physics -- Electromagnetism -- Electricity
• Science -- Physics -- General
• Science -- Physics -- General AAS
• Science -- General
• Science -- General AAS

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