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Optical measurement systems for industrial inspection IV: 13-17 June 2005, Munich, Germany
Publisher: SPIE
ISBN10: 0819458562
ISBN13: 9780819458568
DDC: 670.42/5
LCC: QC367
Edition: (print)
Notes
Includes bibliographical references and author index.
Classification
- LCC: QC367
- Dewey Decimal: 670.42/5
Book Details
- Language: eng
- Physical Description: 2 v. (xviii, 1048 p.) : ill. ; 28 cm.
- Edition Info: (print)
Subjects
- Quality control -- Optical methods -- Congresses
- Optical instruments -- Industrial applications -- Congresses
- Optical detectors -- Industrial applications -- Congresses
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