Loading Prices..

An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems)
Lala, Parag K. 
Publisher: Morgan and Claypool Publishers
ISBN10: 1598293508 ISBN13: 9781598293500 DDC: 621 Edition: Paperback; 2008-11-04

Summary

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Classification

Book Details

Subjects

Buying This Book

We query many merchants so that you can instantly compare prices and availability. You can even check historic prices and subscribe for notifications. For a manual check, clicking on a link will open a new window with a search for this book on the merchant's site of your choice.