1999 IEEE AUTOTESTCON proceedings, AUTOTESTCON '99: IEEE Systems Readiness Technology Conference: Test technology for the new millennium; August 30-September 2, 1999, [San Antonio, Texas]
"IEEE Catalog Number: 99CH36323"--t.p. Includes bibliographical references and author index. Also available in an electronic version.
- LCC: TK7878.4
- Language: eng
- Physical Description: xxix, 830 p. : ill. ; 28 cm.
- Edition Info: (CD-ROM)
- Systems engineering -- Congresses
- Electronic digital computers -- Testing -- Congresses
- Weapons systems -- Technological innovations -- Congresses
- Avionics -- Congresses
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