Joy, David C.
Retrieve the information about Joy, David C. and his books on the go! Keep your project up to date with the ISBNdb book database searchable via API with 19 data points per book available.
Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences, 9)
Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Monte Carlo Modeling for Electron Microscopy and Microanalysis
Christology Re-visited: Profiles And Prospects
This is an excerpt from the ISBNdb database. Need more data? Get a FREE 7 day trial and get access to the full database of over 35 million books and all data points including title, author, publisher, publish date, binding, pages, list price, and more.
Get started Free