Cor Claeys
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Essderc 2004
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270)
Extended Defects in Germanium
Diffusion-Weighted MR Imaging: Applications in the Body (Medical Radiology)
Metal Impurities in Silicon- and Germanium-Based Technologies
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